JEFIZA, Adlian; BELLA NUR AZIZAH; HARRY GUNAWAN. Deteksi Wafer Menggunakan YO-LO Berbasis Barcode. Jurnal Ilmiah Teknik Mesin, Elektro dan Komputer, [S. l.], v. 5, n. 1, p. 96–106, 2025. DOI: 10.51903/juritek.v5i1.4130. Disponível em: https://journalcenter.org/index.php/JURITEK/article/view/4130. Acesso em: 24 may. 2025.